Depletion of Reflectance of Silicon Surface Textured Using Nano Second Fiber Laser

This paper characterizes the surface modification on silicon surfaces with different patterns (circle, pyramid) using a nanosecond fiber laser parameters, which enhances its anti-reflection property. The influence of textured and untextured their structural properties were evaluated. It has long absorption path (200–1000 nm) rougher due to modifications, results in 40% decrease incident light reflectance, especially pyramid-shaped dimples 70 µm size, helping trap more solar cells where anti-reflecting is crucial need for devices used optical photovoltaic applications operate effectively. Scanning electron microscope (SEM) atomic force microscopy (AFM) are examine features determine process’s effectiveness recognize development that deep enough light. XRD micro-Raman spectroscopy irradiated surface’s crystallographic structure crystallinity change.